Peterson, JJ, Kirsch, P, Beisukel, G, Krishuan, S, Majhi, P, Lysaght, P
, Quevedo-Lopez, M, Li, HJ, Senzaki, Y, Harris, R, Young, CD, Choi, R, Sim, J, Barnett, J, Moumen, N, Huffmau, C, Gardner, MI, Brown, GA, Zeitzoff, PM, Lee, BH, Ramiller, C & Huff, HR 2006, '
Technology and reliability challenges of SUB-nm EOT high-κ/ metal gate electrode transistors', Paper presented at Proceedings - Electrochemical Society,
1/12/06 pp. 105-118. <
https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=52649145350&origin=inward>