Understanding the effects of low-temperature passivation and annealing on ZnO TFTs test structures

Rodolfo A. Rodriguez-Davila, Pavel Bolshakov, Chadwin D. Young, Manuel Quevedo-Lopez

Research output: Contribution to conferencePaper

Original languageAmerican English
Pages190-193
Number of pages4
DOIs
StatePublished - 1 Mar 2019
Externally publishedYes
EventIEEE International Conference on Microelectronic Test Structures -
Duration: 1 Mar 2019 → …

Conference

ConferenceIEEE International Conference on Microelectronic Test Structures
Period1/03/19 → …

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