Keyphrases
Chemical Bath Deposition Method
70%
Thermal Annealing
60%
Thin-film Transistors
55%
Plumbonacrite
41%
Selenium
41%
Complexing Agent
41%
Chemical Bath Deposition
40%
X-ray Photoelectron Spectroscopy
38%
Active Layer
35%
Electrical Characteristics
32%
Rongalite
32%
Structural Properties
31%
Pollutant Distribution
27%
Cd Treatment
27%
PbSe Films
27%
Cadmium Sulfide
27%
Ionic Exchange
27%
Cadmium Sulphide Thin Films
27%
Fourier Transform
27%
Gasses
27%
Silica
26%
Resistivity
25%
Channel Length
24%
Si Substrate
23%
Annealing
23%
X Ray Diffraction
21%
Band Gap
20%
Energy Band Gap
19%
Forming Gas
18%
Cadmium Chloride
18%
Optical Properties
18%
Triethanolamine
17%
Semiconductors
17%
Chromium
17%
Threshold Voltage
17%
Direct Band Gap
14%
Elemental Silver
13%
Non-ideal Effects
13%
SrSe
13%
Zinc Sulfide Nanoparticles
13%
Selenide
13%
Copper Selenide
13%
Copper Telluride
13%
Fabrication Characteristics
13%
Pb3O4
13%
Metal-semiconductor Nanocomposite
13%
Degradable Composite
13%
Incineration
13%
Fish Tissue
13%
Cylindrical Symmetry
13%
Material Science
Film
100%
Thin Films
64%
X-Ray Diffraction
45%
Scanning Electron Microscopy
45%
Annealing
42%
Thin-Film Transistor
41%
Raman Spectroscopy
39%
Oxide Compound
38%
Morphology
35%
X-Ray Photoelectron Spectroscopy
31%
Cadmium
30%
Structural Property
27%
Electrical Resistivity
24%
Absorption Spectra
19%
Chromium
15%
Surface Morphology
15%
Surface (Surface Science)
15%
Composite Material
13%
Nanocomposite
13%
Strontium
13%
Clathrate
13%
Energy-Dispersive X-Ray Spectroscopy
13%
Zinc Sulfide Nanoparticles
13%
Composite Material
13%
Polylactide
13%
ZnO
13%
Stabilizer (Agent)
13%
Zinc Oxide
13%
Sol-Gel
13%
Polyethyleneimine
13%
High-Resolution Transmission Electron Microscopy
11%
Polyethylene
10%
Scanning Transmission Electron Microscopy
9%
Transmission Electron Microscopy
8%
Zinc Ion
8%
Crystallite Size
6%
Diffraction Pattern
6%
Hafnium
6%
Compatibilizer
6%
Silicon Dioxide
6%
Crystal Structure
6%
Zinc
5%
Engineering
Thin-Film Transistor
41%
Active Layer
31%
Monitoring Program
27%
Thin Films
27%
Complexing Agent
27%
Fourier Transform
27%
Band Gap Energy
26%
Silicon Dioxide
26%
Si Substrate
23%
Annealing Temperature
16%
Ray Diffraction
15%
Polycrystalline
13%
Clathrate
13%
Zinc Sulfide Nanoparticles
13%
Nanorod
13%
Surface Morphology
13%
Glass Slide
13%
One Step
13%
Stabilizer
13%
Ion Exchange
13%
Structural Property
13%
Channel Length
12%
Band Gap
11%
Crystalline Phase
10%
Room Temperature
10%
Heat Treatment
9%
Electrical Device
9%
Deposition Process
9%
Current Ratio
9%
Electrical Performance
9%
Annealing Process
9%
Irregular Shape
6%
Amorphous Phase
6%
Metallic Silver
6%
Oxide Layer
6%
Cross Section
6%
Deposition Time
6%
Crystallite Size
6%
Electronic Scanning
6%
Electrical Measurement
6%
Glass Substrate
6%
Gap Value
6%
Crystal Structure
6%
Absorptivity
6%
