Anomalous stokes shift of colloidal quantum dots

J. E. Pelayo-Ceja, A. Zazueta-Raynaud, R. Lopez-Delgado, E. Saucedo-Flores, R. Ruelas-Lepe, F. Orona-Magallanes, R. Guerrero-Gonzalez, A. Ayon

Producción científica: Capítulo del libro/informe/acta de congresoContribución a la conferenciarevisión exhaustiva

1 Cita (Scopus)

Resumen

We report an anomalous Stokes shift effect (SSE) observed in colloidal solutions containing down-shifting Carbon quantum dots (CQDs) of different sizes that is expected to have a positive influence on the power conversion efficiency of photovoltaic structures. Specifically, with an excitation wavelength of 390 nm, individual colloidal solutions of CQDs whose diameter was determined by the applied current during synthesis, exhibited photoluminescent (PL) emission wavelength peaks centered at 420 nm. However, the colloidal solution comprising the mixture of all the previously synthesized CQDs of different diameters was observed to have an anomalous PL Stokes shift centered at 515 nm. Furthermore, the aforementioned anomalous SSE was also observed in CdTe QDs when added to the CQD mixed-solution (CMS). Thus, whereas a mixture of CdTe QDs of different sizes, exhibited a down-shifted photoluminescence centered at 555 nm, the peak was observed to have an anomalous Stokes shift centered at 580 nm when combined with the CMS. Quantum dot characterization included crystal structure analysis as well as photon absorption and photoluminescence wavelengths.

Idioma originalInglés
Título de la publicación alojadaSymposium on Design, Test, Integration and Packaging of MEMS/MOEMS, DTIP 2018
EditoresRomolo Marcelli, Yoshio Mita, Stewart Smith, Francis Pressecq, Pascal Nouet, Frederick Mailly, Peter Schneider
EditorialInstitute of Electrical and Electronics Engineers Inc.
Páginas1-4
Número de páginas4
ISBN (versión digital)9781538661994
DOI
EstadoPublicada - 22 jun. 2018
Evento20th Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2018 - Roma, Italia
Duración: 22 may. 201825 may. 2018

Serie de la publicación

NombreSymposium on Design, Test, Integration and Packaging of MEMS/MOEMS, DTIP 2018

Conferencia

Conferencia20th Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2018
País/TerritorioItalia
CiudadRoma
Período22/05/1825/05/18

Nota bibliográfica

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© 2018 IEEE.

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