Deposition and Structural Characterization of Mg-Zn Co-doped GaN Films Deposited by Radio-Frequency Magnetron Sputtering in N2-Ar Evironment

Rafael Garcia

doi:10.3390/cryst14070618

Deposition and Structural Characterization of Mg-Zn Co-doped GaN Films Deposited by Radio-Frequency Magnetron Sputtering in N2-Ar Evironment

Departamento de Investigación en Física

Producción científica: Contribución a una revista › Artículo › revisión exhaustiva

Idioma original	Inglés
Páginas (desde-hasta)	1 -10
Número de páginas	10
Publicación	Crystals
Volumen	14
N.º	618
DOI	https://doi.org/10.3390/cryst14070618
Estado	Publicada - 4 jul. 2024

Acceder al documento

10.3390/cryst14070618

Citar esto

@article{b18a77ef19bc433ba6631371f9139791,

title = "Deposition and Structural Characterization of Mg-Zn Co-doped GaN Films Deposited by Radio-Frequency Magnetron Sputtering in N2-Ar Evironment",

author = "Rafael Garcia",

year = "2024",

month = jul,

day = "4",

doi = "10.3390/cryst14070618",

language = "Ingl{\'e}s",

volume = "14",

pages = "1 --10",

journal = "Crystals",

issn = "2073-4352",

publisher = "Multidisciplinary Digital Publishing Institute (MDPI)",

number = "618",

}