Electroreflectance, photoreflectance, and photoabsorption properties of polycrystalline CdTe thin films prepared by the gradient recrystallization and growth technique

C. Vázquez-López, H. Navarro, Raúl Aceves, M. C. Vargas, Cornelius A. Menezes

Resultado de la investigación: Contribución a una revistaArtículo

14 Citas (Scopus)
Idioma originalInglés estadounidense
Páginas (desde-hasta)2066-2069
Número de páginas4
PublicaciónJournal of Applied Physics
DOI
EstadoPublicada - 1 dic 1985
Publicado de forma externa

Huella dactilar

photoabsorption
gradients
single crystals
thin films
energy
room temperature

Citar esto

@article{01d2d1ee055144a29fc28e33f0926eaf,
title = "Electroreflectance, photoreflectance, and photoabsorption properties of polycrystalline CdTe thin films prepared by the gradient recrystallization and growth technique",
author = "C. V{\'a}zquez-L{\'o}pez and H. Navarro and Ra{\'u}l Aceves and Vargas, {M. C.} and Menezes, {Cornelius A.}",
year = "1985",
month = "12",
day = "1",
doi = "10.1063/1.335965",
language = "American English",
pages = "2066--2069",
journal = "Journal of Applied Physics",
issn = "0021-8979",
publisher = "American Institute of Physics",

}

Electroreflectance, photoreflectance, and photoabsorption properties of polycrystalline CdTe thin films prepared by the gradient recrystallization and growth technique. / Vázquez-López, C.; Navarro, H.; Aceves, Raúl; Vargas, M. C.; Menezes, Cornelius A.

En: Journal of Applied Physics, 01.12.1985, p. 2066-2069.

Resultado de la investigación: Contribución a una revistaArtículo

TY - JOUR

T1 - Electroreflectance, photoreflectance, and photoabsorption properties of polycrystalline CdTe thin films prepared by the gradient recrystallization and growth technique

AU - Vázquez-López, C.

AU - Navarro, H.

AU - Aceves, Raúl

AU - Vargas, M. C.

AU - Menezes, Cornelius A.

PY - 1985/12/1

Y1 - 1985/12/1

U2 - 10.1063/1.335965

DO - 10.1063/1.335965

M3 - Article

SP - 2066

EP - 2069

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

ER -