Resumen
The electromagnetic near-field produced by the interaction between a transverse electric guided mode and a surface nano-defect in a planar structure is studied. A Fourier Transform technique is used to obtain the surface defect profile.
Idioma original | Inglés |
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Título de la publicación alojada | Optical Interference Coatings, OIC 2004 |
Editorial | Optica Publishing Group (formerly OSA) |
ISBN (versión digital) | 3540003649 |
Estado | Publicada - 2004 |
Evento | Optical Interference Coatings, OIC 2004 - Tucson, Estados Unidos Duración: 27 jun. 2004 → 2 jul. 2004 |
Serie de la publicación
Nombre | Optics InfoBase Conference Papers |
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ISSN (versión digital) | 2162-2701 |
Conferencia
Conferencia | Optical Interference Coatings, OIC 2004 |
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País/Territorio | Estados Unidos |
Ciudad | Tucson |
Período | 27/06/04 → 2/07/04 |
Nota bibliográfica
Publisher Copyright:© 2004 OSA - The Optical Society. All rights reserved.