Investigation of X-ray Irradiation Impact on CeRAM

A. A. Gruszecki; L. Fernandez-Izquierdo; S. V. Suryavanshi; G. Yeric; M. Quevedo-Lopez; C. D. Young

doi:10.1109/IIRW59383.2023.10477713

Investigation of X-ray Irradiation Impact on CeRAM

A. A. Gruszecki^*, L. Fernandez-Izquierdo, S. V. Suryavanshi, G. Yeric, M. Quevedo-Lopez, C. D. Young

^*Autor correspondiente de este trabajo

Departamento de Investigación en Polímeros y Materiales

Producción científica: Capítulo del libro/informe/acta de congreso › Contribución a la conferencia › revisión exhaustiva

Resumen

CeRAM devices were fabricated and electrically characterized following x-ray irradiation exposure for the purpose of investigating device reliability and operation in harsh environments. CeRAM were subjected to a total ionizing dose (TID) of up to 1 Mrad, which was found to induce resistance switching (RS) of the memory state. TID was determined to have no impact on RS parameters, including both switching voltages and resistance levels.

Idioma original	Inglés
Título de la publicación alojada	2023 IEEE International Integrated Reliability Workshop, IIRW 2023
Editorial	Institute of Electrical and Electronics Engineers Inc.
ISBN (versión digital)	9798350327274
DOI	https://doi.org/10.1109/IIRW59383.2023.10477713
Estado	Publicada - 2023
Evento	2023 IEEE International Integrated Reliability Workshop, IIRW 2023 - South Lake Tahoe, Estados Unidos Duración: 8 oct. 2023 → 12 oct. 2023

Serie de la publicación

Nombre	IEEE International Integrated Reliability Workshop Final Report
ISSN (versión impresa)	1930-8841
ISSN (versión digital)	2374-8036

Conferencia

Conferencia	2023 IEEE International Integrated Reliability Workshop, IIRW 2023
País/Territorio	Estados Unidos
Ciudad	South Lake Tahoe
Período	8/10/23 → 12/10/23

Nota bibliográfica

Publisher Copyright:
© 2023 IEEE.

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10.1109/IIRW59383.2023.10477713

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Gruszecki, A. A., Fernandez-Izquierdo, L., Suryavanshi, S. V., Yeric, G., Quevedo-Lopez, M., & Young, C. D. (2023). Investigation of X-ray Irradiation Impact on CeRAM. En 2023 IEEE International Integrated Reliability Workshop, IIRW 2023 (IEEE International Integrated Reliability Workshop Final Report). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IIRW59383.2023.10477713

@inproceedings{0781bdd47e414bc18e01a80ea8384c10,

title = "Investigation of X-ray Irradiation Impact on CeRAM",

abstract = "CeRAM devices were fabricated and electrically characterized following x-ray irradiation exposure for the purpose of investigating device reliability and operation in harsh environments. CeRAM were subjected to a total ionizing dose (TID) of up to 1 Mrad, which was found to induce resistance switching (RS) of the memory state. TID was determined to have no impact on RS parameters, including both switching voltages and resistance levels.",

author = "Gruszecki, {A. A.} and L. Fernandez-Izquierdo and Suryavanshi, {S. V.} and G. Yeric and M. Quevedo-Lopez and Young, {C. D.}",

note = "Publisher Copyright: {\textcopyright} 2023 IEEE.; 2023 IEEE International Integrated Reliability Workshop, IIRW 2023 ; Conference date: 08-10-2023 Through 12-10-2023",

year = "2023",

doi = "10.1109/IIRW59383.2023.10477713",

language = "Ingl{\'e}s",

series = "IEEE International Integrated Reliability Workshop Final Report",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "2023 IEEE International Integrated Reliability Workshop, IIRW 2023",

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Gruszecki, AA, Fernandez-Izquierdo, L, Suryavanshi, SV, Yeric, G, Quevedo-Lopez, M & Young, CD 2023, Investigation of X-ray Irradiation Impact on CeRAM. En 2023 IEEE International Integrated Reliability Workshop, IIRW 2023. IEEE International Integrated Reliability Workshop Final Report, Institute of Electrical and Electronics Engineers Inc., 2023 IEEE International Integrated Reliability Workshop, IIRW 2023, South Lake Tahoe, Estados Unidos, 8/10/23. https://doi.org/10.1109/IIRW59383.2023.10477713

Investigation of X-ray Irradiation Impact on CeRAM. / Gruszecki, A. A.; Fernandez-Izquierdo, L.; Suryavanshi, S. V. et al.
2023 IEEE International Integrated Reliability Workshop, IIRW 2023. Institute of Electrical and Electronics Engineers Inc., 2023. (IEEE International Integrated Reliability Workshop Final Report).

Producción científica: Capítulo del libro/informe/acta de congreso › Contribución a la conferencia › revisión exhaustiva

TY - GEN

T1 - Investigation of X-ray Irradiation Impact on CeRAM

AU - Gruszecki, A. A.

AU - Fernandez-Izquierdo, L.

AU - Suryavanshi, S. V.

AU - Yeric, G.

AU - Quevedo-Lopez, M.

AU - Young, C. D.

PY - 2023

Y1 - 2023

N2 - CeRAM devices were fabricated and electrically characterized following x-ray irradiation exposure for the purpose of investigating device reliability and operation in harsh environments. CeRAM were subjected to a total ionizing dose (TID) of up to 1 Mrad, which was found to induce resistance switching (RS) of the memory state. TID was determined to have no impact on RS parameters, including both switching voltages and resistance levels.

AB - CeRAM devices were fabricated and electrically characterized following x-ray irradiation exposure for the purpose of investigating device reliability and operation in harsh environments. CeRAM were subjected to a total ionizing dose (TID) of up to 1 Mrad, which was found to induce resistance switching (RS) of the memory state. TID was determined to have no impact on RS parameters, including both switching voltages and resistance levels.

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DO - 10.1109/IIRW59383.2023.10477713

M3 - Contribución a la conferencia

AN - SCOPUS:85190389022

T3 - IEEE International Integrated Reliability Workshop Final Report

BT - 2023 IEEE International Integrated Reliability Workshop, IIRW 2023

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2023 IEEE International Integrated Reliability Workshop, IIRW 2023

Y2 - 8 October 2023 through 12 October 2023

ER -

Gruszecki AA, Fernandez-Izquierdo L, Suryavanshi SV, Yeric G, Quevedo-Lopez M, Young CD. Investigation of X-ray Irradiation Impact on CeRAM. En 2023 IEEE International Integrated Reliability Workshop, IIRW 2023. Institute of Electrical and Electronics Engineers Inc. 2023. (IEEE International Integrated Reliability Workshop Final Report). doi: 10.1109/IIRW59383.2023.10477713

Investigation of X-ray Irradiation Impact on CeRAM

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