Optical response and light scattering measurements from a planar guided wave

Raúl García-Llamas*, Aldo S. Ramírez-Duverger, Jorge Gaspar-Armenta, Raúl Aceves-Torres

*Autor correspondiente de este trabajo

Producción científica: Capítulo del libro/informe/acta de congresoContribución a la conferenciarevisión exhaustiva

Resumen

Experimental results of reflection and light scattering measurements using the technique of attenuated total reflection (ATR) in the Kretschmann configuration of a system when it is excited an electromagnetic guided mode are reported. The system used is BK7 glass-prism/Dielectric1/Dielectric2/ Dielectric1/air, where the refractive index of dielectricl is less than the refractive index of the dielectric2. It was found a dip in the specular reflection as a function of the incident angle due to the excitation of a guided mode in the dielectric2 film. The guided mode was found for s polarization of the incident light. The angular dependence of the scattered light displays a peak caused by single-scattering and located approximately at the angles of excitation of the guided modes whose normalized wave numbers are less than the refractive index of the glass. Values of thickness, refractive index and absorption index obtained from Lorentz dispersion model of the film are reported.

Idioma originalInglés
Título de la publicación alojadaAdvances in Thin-Film Coatings for Optical Applications III
DOI
EstadoPublicada - 2006
EventoAdvances in Thin-Film Coatings for Optical Applications III - San Diego, CA, Estados Unidos
Duración: 13 ago. 200614 ago. 2006

Serie de la publicación

NombreProceedings of SPIE - The International Society for Optical Engineering
Volumen6286
ISSN (versión impresa)0277-786X

Conferencia

ConferenciaAdvances in Thin-Film Coatings for Optical Applications III
País/TerritorioEstados Unidos
CiudadSan Diego, CA
Período13/08/0614/08/06

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