Resumen
Lead zirconate titanate, Pb(Zr0.53,Ti0.47)O 3 or PZT, thin films and integrated cantilevers have been fabricated for energy harvesting applications. The PZT films were deposited on PECVD SiO2/Si substrates with a sol-gel derived ZrO2 buffer layer. It is found that lead content in the starting solution and ramp rate during film crystallization are critical to achieving large-grained films on the ZrO2 surface. The electrical properties of the PZT films were measured using metal-ferroelectric-metal and inter-digital electrode structures, and revealed substantial improvement in film properties by controlling the process conditions. Functional cantilevers are demonstrated using the optimized films with output of 1.4 V peak-to-peak at 1 kHz and 2.5 g.
| Idioma original | Inglés |
|---|---|
| Páginas (desde-hasta) | 89-93 |
| Número de páginas | 5 |
| Publicación | Solid-State Electronics |
| Volumen | 63 |
| N.º | 1 |
| DOI | |
| Estado | Publicada - sep. 2011 |
| Publicado de forma externa | Sí |