TY - JOUR
T1 - Parameter Extraction Using the Output Characteristics of Thin-Film Transistors in Weak-Conduction and Triode-Region
AU - Avila-Avendano, Carlos
AU - Ortiz-Conde, Adelmo
AU - Caraveo-Frescas, Jesus A.
AU - Quevedo-Lopez, Manuel A.
N1 - Publisher Copyright:
© 2020, The Korean Institute of Electrical and Electronic Material Engineers.
PY - 2021/8
Y1 - 2021/8
N2 - A novel method for the parameter extraction of thin-film transistors in weak-conduction and triode-region is presented. The parameter extraction is performed using two different and consistent functions based on the integration of experimental output characteristic. The method was tested using measured data of polycrystalline silicon (poly-Si) thin-film transistors (TFTs) and the results were compared with previously reported conventional methods.
AB - A novel method for the parameter extraction of thin-film transistors in weak-conduction and triode-region is presented. The parameter extraction is performed using two different and consistent functions based on the integration of experimental output characteristic. The method was tested using measured data of polycrystalline silicon (poly-Si) thin-film transistors (TFTs) and the results were compared with previously reported conventional methods.
KW - Contact ideality factor
KW - MOSFET
KW - Parameter extraction
KW - Thin-film transistors (TFTs)
KW - Triode-region
KW - Weak-inversion output characteristic
UR - http://www.scopus.com/inward/record.url?scp=85096397598&partnerID=8YFLogxK
U2 - 10.1007/s42341-020-00268-y
DO - 10.1007/s42341-020-00268-y
M3 - Artículo
AN - SCOPUS:85096397598
SN - 1229-7607
VL - 22
SP - 550
EP - 556
JO - Transactions on Electrical and Electronic Materials
JF - Transactions on Electrical and Electronic Materials
IS - 4
ER -