TY - JOUR
T1 - Resonant scattering of light measurements from a system with rough interfaces that supports guided modes
AU - Ramírez-Duverger, Aldo S.
AU - Gaspar-Armenta, Jorge A.
AU - García-Llamas, Raúl
PY - 2002
Y1 - 2002
N2 - We reported experimental results of the resonant scattering of light from a system prism-glass/Ag/MgF2/air in the ATR-Kretschmann configuration, for p-polarized light incident by the glass side. The thickness of the dielectric film is chosen in such a way that in the absence of roughness the system supports 3 transverse magnetic (TM) guided modes, at a wavelength λ = 632.8 nm of the incident light. The scattering is due to the natural roughness of each interface of the system, while the resonant character of the scattering is due to the excitation of the guided modes and their interaction with the interfaces roughness. The scattered light shows six peaks at angles given by θ1 = ± 61.65° θ2 = ± 53.69°, and θ3 = ± 43.40°, for any angle of incidence. These angles correspond to the excitation of the guided modes. The scattering response is enhanced when the angle of incidence is equal to one of the angles of excitation of the guided modes.
AB - We reported experimental results of the resonant scattering of light from a system prism-glass/Ag/MgF2/air in the ATR-Kretschmann configuration, for p-polarized light incident by the glass side. The thickness of the dielectric film is chosen in such a way that in the absence of roughness the system supports 3 transverse magnetic (TM) guided modes, at a wavelength λ = 632.8 nm of the incident light. The scattering is due to the natural roughness of each interface of the system, while the resonant character of the scattering is due to the excitation of the guided modes and their interaction with the interfaces roughness. The scattered light shows six peaks at angles given by θ1 = ± 61.65° θ2 = ± 53.69°, and θ3 = ± 43.40°, for any angle of incidence. These angles correspond to the excitation of the guided modes. The scattering response is enhanced when the angle of incidence is equal to one of the angles of excitation of the guided modes.
KW - Guided modes
KW - Roughness
KW - Scattering
KW - Thin films
UR - http://www.scopus.com/inward/record.url?scp=0036980563&partnerID=8YFLogxK
U2 - 10.1117/12.450896
DO - 10.1117/12.450896
M3 - Artículo de la conferencia
AN - SCOPUS:0036980563
SN - 0277-786X
VL - 4805
SP - 35
EP - 40
JO - Proceedings of SPIE - The International Society for Optical Engineering
JF - Proceedings of SPIE - The International Society for Optical Engineering
T2 - Design and Fabrication of Planar Optical Waveguide Devices and Materials
Y2 - 8 July 2002 through 9 July 2002
ER -