Strain effects on the energy band-gap in oxygenated CdTe thin films studied by photoreflectance

L. N. Alejo-Armenta*, F. J. Espinoza-Beltrán, C. A. Alejo-Armenta, C. Vázquez-López, H. Arizpe-Chávez, R. Ramírez-Bon, O. Zelaya-Angel, J. González-Hernández

*Autor correspondiente de este trabajo

Producción científica: Contribución a una revistaArtículorevisión exhaustiva

5 Citas (Scopus)

Resumen

The incorporation of oxygen during the preparation of sputtered CdTe films produces a strong strain of the zincblende (cubic) lattice. First as a consequence of this, the energy band-gap shifts to lower energies and then, for larger strains, the degeneracy of the hole valence bands splits into two bands at the fundamental band-gap. These two transitions were measured using photo-reflectance spectroscopy (PRS) as a function of the oxygen content. The energy band-gap shift resulting from tensile stress in the films was calculated using the elastic constants and deformation potentials for CdTe as well as the measured interplanar spacing values of the (1 1 1) CdTe X-ray diffraction peak.

Idioma originalInglés
Páginas (desde-hasta)807-811
Número de páginas5
PublicaciónJournal of Physics and Chemistry of Solids
Volumen60
N.º6
DOI
EstadoPublicada - jun. 1999

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