TY - JOUR
T1 - Structural, optical and electrical characterization of In/CdS/glass thermally annealed system
AU - Castillo, S. J.
AU - Mendoza-Galván, A.
AU - Ramírez-Bon, R.
AU - Espinoza-Beltrán, F. J.
AU - Sotelo-Lerma, M.
AU - González-Hernández, J.
AU - Martínez, G.
N1 - Funding Information:
This work was partially supported by CONACyT.
PY - 2000/9/3
Y1 - 2000/9/3
N2 - Chemical bath deposited CdS thin films coated with an evaporated indium thin film were analyzed by electrical, optical absorption, spectroscopic ellipsometry, X-ray and AFM measurements. As-deposited and thermally annealed (250-400 °C) samples were evaluated. Heat treatments promote the formation of an external In2O3 layer, as revealed by X-ray data. Indium atoms diffuse to the CdS layer from an intermediate indium layer. CdS doped with In with resistivities of approximately 10-1-10-2 Ω/cm were obtained after annealing the In/CdS/glass system at 350 and 400 °C. From the ellipsometry spectra, the evolution of the initial two-layer structure, In/CdS/glass, with thermal annealing was investigated. The analysis shows a more complex structure than the In2O3/In/CdS/glass structure previously proposed.
AB - Chemical bath deposited CdS thin films coated with an evaporated indium thin film were analyzed by electrical, optical absorption, spectroscopic ellipsometry, X-ray and AFM measurements. As-deposited and thermally annealed (250-400 °C) samples were evaluated. Heat treatments promote the formation of an external In2O3 layer, as revealed by X-ray data. Indium atoms diffuse to the CdS layer from an intermediate indium layer. CdS doped with In with resistivities of approximately 10-1-10-2 Ω/cm were obtained after annealing the In/CdS/glass system at 350 and 400 °C. From the ellipsometry spectra, the evolution of the initial two-layer structure, In/CdS/glass, with thermal annealing was investigated. The analysis shows a more complex structure than the In2O3/In/CdS/glass structure previously proposed.
UR - http://www.scopus.com/inward/record.url?scp=0034262856&partnerID=8YFLogxK
U2 - 10.1016/S0040-6090(00)01080-4
DO - 10.1016/S0040-6090(00)01080-4
M3 - Artículo
SN - 0040-6090
VL - 373
SP - 10
EP - 14
JO - Thin Solid Films
JF - Thin Solid Films
IS - 1-2
ER -