Study of the growth of pbs thin films on common glass, HfO2/Si and SiO2/Si substrates, prepared by CBD

L. Ruiz-Preciado; M. A. Quevedo-López; A. G. Rojas-Hernández; L. P. Ramírez-Rodríguez; T. Mendivil-Reynoso; A. Apolinar-Iribe; A. De Leon; S. J. Castillo

Study of the growth of pbs thin films on common glass, HfO₂/Si and SiO₂/Si substrates, prepared by CBD

L. Ruiz-Preciado, M. A. Quevedo-López, A. G. Rojas-Hernández, L. P. Ramírez-Rodríguez, T. Mendivil-Reynoso, A. Apolinar-Iribe, A. De Leon^*, S. J. Castillo

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Resumen

The goal of this work is to compare Lead Sulfide Thin Films grown on three different substrates: common glass a Hafnium oxide layer and a silicon dioxide layer. The morphology and cross section was characterized through SEM; XRD was utilized to chemically identify the compound and its structure; XPS was used to assure the chemical composition; and electrical measurements were performed to evaluate the resistivity. The morphology varies greatly from a smooth granulate amorphous phase to a polycrystalline clustered surface. All polycrystalline films are cubic Lead Sulfide. The clusters in these layers have crystallite sizes between 9 and 22 nm ranges. The obtained values for resistivity were 35.62 WΩcm, and 13.50 WΩcm for the samples with deposition time of 20 and 40 minutes, respectively.

Idioma original	Inglés
Páginas (desde-hasta)	1205-1211
Número de páginas	7
Publicación	Digest Journal of Nanomaterials and Biostructures
Volumen	11
N.º	4
Estado	Publicada - 1 oct. 2016

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© 2016, Inst Materials Physics. All rights reserved.

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title = "Study of the growth of pbs thin films on common glass, HfO2/Si and SiO2/Si substrates, prepared by CBD",

abstract = "The goal of this work is to compare Lead Sulfide Thin Films grown on three different substrates: common glass a Hafnium oxide layer and a silicon dioxide layer. The morphology and cross section was characterized through SEM; XRD was utilized to chemically identify the compound and its structure; XPS was used to assure the chemical composition; and electrical measurements were performed to evaluate the resistivity. The morphology varies greatly from a smooth granulate amorphous phase to a polycrystalline clustered surface. All polycrystalline films are cubic Lead Sulfide. The clusters in these layers have crystallite sizes between 9 and 22 nm ranges. The obtained values for resistivity were 35.62 WΩcm, and 13.50 WΩcm for the samples with deposition time of 20 and 40 minutes, respectively.",

keywords = "Chemical bath deposition, Lead sulfide, Semiconductors",

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T1 - Study of the growth of pbs thin films on common glass, HfO2/Si and SiO2/Si substrates, prepared by CBD

AU - Ruiz-Preciado, L.

AU - Quevedo-López, M. A.

AU - Rojas-Hernández, A. G.

AU - Ramírez-Rodríguez, L. P.

AU - Mendivil-Reynoso, T.

AU - Apolinar-Iribe, A.

AU - De Leon, A.

AU - Castillo, S. J.

PY - 2016/10/1

Y1 - 2016/10/1

N2 - The goal of this work is to compare Lead Sulfide Thin Films grown on three different substrates: common glass a Hafnium oxide layer and a silicon dioxide layer. The morphology and cross section was characterized through SEM; XRD was utilized to chemically identify the compound and its structure; XPS was used to assure the chemical composition; and electrical measurements were performed to evaluate the resistivity. The morphology varies greatly from a smooth granulate amorphous phase to a polycrystalline clustered surface. All polycrystalline films are cubic Lead Sulfide. The clusters in these layers have crystallite sizes between 9 and 22 nm ranges. The obtained values for resistivity were 35.62 WΩcm, and 13.50 WΩcm for the samples with deposition time of 20 and 40 minutes, respectively.

AB - The goal of this work is to compare Lead Sulfide Thin Films grown on three different substrates: common glass a Hafnium oxide layer and a silicon dioxide layer. The morphology and cross section was characterized through SEM; XRD was utilized to chemically identify the compound and its structure; XPS was used to assure the chemical composition; and electrical measurements were performed to evaluate the resistivity. The morphology varies greatly from a smooth granulate amorphous phase to a polycrystalline clustered surface. All polycrystalline films are cubic Lead Sulfide. The clusters in these layers have crystallite sizes between 9 and 22 nm ranges. The obtained values for resistivity were 35.62 WΩcm, and 13.50 WΩcm for the samples with deposition time of 20 and 40 minutes, respectively.

KW - Chemical bath deposition

KW - Lead sulfide

KW - Semiconductors

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M3 - Artículo

SN - 1842-3582

VL - 11

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EP - 1211

JO - Digest Journal of Nanomaterials and Biostructures

JF - Digest Journal of Nanomaterials and Biostructures

IS - 4