Study of the growth of pbs thin films on common glass, HfO₂/Si and SiO₂/Si substrates, prepared by CBD

The goal of this work is to compare Lead Sulfide Thin Films grown on three different substrates: common glass a Hafnium oxide layer and a silicon dioxide layer. The morphology and cross section was characterized through SEM; XRD was utilized to chemically identify the compound and its structure; XPS was used to assure the chemical composition; and electrical measurements were performed to evaluate the resistivity. The morphology varies greatly from a smooth granulate amorphous phase to a polycrystalline clustered surface. All polycrystalline films are cubic Lead Sulfide. The clusters in these layers have crystallite sizes between 9 and 22 nm ranges. The obtained values for resistivity were 35.62 WΩcm, and 13.50 WΩcm for the samples with deposition time of 20 and 40 minutes, respectively.