Ingeniería y ciencia de los materiales
Thin films
100%
Characterization (materials science)
92%
Lead
65%
Photoelectrons
55%
Band structure
49%
Profilometry
49%
Atomic force microscopy
44%
Sulfides
40%
Energy gap
40%
Surface morphology
39%
Optical microscopy
38%
Film thickness
38%
X rays
31%
Oxygen
28%
Scanning electron microscopy
27%
Carbon
26%
Fibers
24%
Chemical analysis
22%
Física y astronomía
synthesis
76%
characterization
58%
thin films
54%
lead sulfides
49%
homogeneity
33%
energy bands
32%
baths
31%
photoelectrons
31%
chemical composition
31%
film thickness
28%
atomic force microscopy
26%
microscopy
24%
formulations
24%
carbon
23%
scanning electron microscopy
22%
oxygen
21%
fibers
19%
x rays
15%
Química
Liquid Film
51%
X-Ray Photoelectron Spectrum
39%
Deposition Technique
38%
Electronic Band Structure
35%
Surface
33%
Homogeneity
31%
Optical Microscopy
31%
Sulfide
27%
Atomic Force Microscopy
27%
Band Gap
26%
Shape
23%
Molecular Cluster
23%
Fiber
22%
Scanning Electron Microscopy
21%
Modification
19%
Dioxygen
17%
Carbon Atom
16%